Equipotential surface identification of punctual electrically system charges using measurement results

Profile Measurement of Resist Surface Using Multi-Array-Probe System

Semiconductor processing in manufacturing must be fast and highly accurate in the measuring of the surface profile of soft thin films such as photoresist. Since photoresist surface is very smooth and deformable, a device to measure is required that will measure vertical direction with a nanometer resolution in height and not damage the film during the measurement. To do this, we developed an ap...

Altitude measurement using laser beam reflected from water surface

In this paper altitude measurement from water surface using laser beam is presented. Research data indicate that the reflection of infrared waves from water surface is about zero and it is less than 2% for visible radiations. Phase-shift and heterodyne technique was used for the measurement, and the laser beam ( mW p nm 10 , 700 = = l ) was modulated by a sine wave having a fixed frequency....

Non-linear System Identification Using Frequency Domain Measurement Data

In this paper, an efficient method for identifying non-linear element positions and their physical parameters within a multiple degree of system or structure is presented. The local non-linear stiffness and damping restoring forces are first modeled with polynomial series functions of the relative displacements and velocities, respectively. Second, an iterative equation between excitation and r...

Punctual Coalescing

Compilers use register coalescing to avoid generating code for copy instructions. For architectures with register aliasing such as x86, Smith, Ramsey, and Holloway (2004) presented a polynomial-time approach, while Scholz and Eckstein (2002) presented an optimal, exponential-time approach together with a near-optimal, quadratic-time heuristic. Both methods scale poorly after aggressive live ran...

Theory of Charges near a Jellium Surface